The UEGO Sensor I/O task is a uego sensor simulator by Concurrent, applicable to the CP-UEGO-4 card. The card has 4 channels. You can also simulate applying faults to the UN, VM, IP, and IA/RL lines.
CP-UEGO-4
WC-UEGO
ICS-SWB-1283
Channel Mapping
For each channel, you can map:
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Probe Properties:
The Probe Properties pane allows you to configure each channel of the UEGO sensor.
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This I/O task uses λ and cell temperature to calculate the Ip, cell voltage, and cell resistance values on a per-channel basis. These values are written to the UEGO card. To validate these calculated outputs via the driver interface:
uegoin
and uegoout
in the I/O Tasks tab in the Control Centre.uego
test in the Hardware-Tests/UEGO project.Use the Cell λ/Ip curve to determine the expected Ip value for the specified λ value. Similarly, use the Cell °/R curve to determine the cell resistance value for the specified cell temperature. Use the mouse to hover over the graph in each of the curve tabs to see the expected value for the given X axis quantity.
/usr/local/CCRT/drivers/ccuruego/test/lib/ccuruego_tst_libA menu with many options appears. Select option 33 (DIGITAL POTENTIOMETER MENU). A submenu appears. Select 3 (Digital Potentiometer Get Resistance). The output displays the resistance on a per-channel basis in the Ohms column.
/usr/local/CCRT/drivers/ccuruego/test/lib/ccuruego_tst_libA menu with many options appears. Select option 32 (DAC CONTROL MENU). A submenu appears. Select 3 (DAC Read Channels). The output displays the DAC Offset and the DAC Reference values on a per-channel basis.
Note: There may be quantization errors that lead to some negligible variance between the values displayed in the Control Center I/O mappings pane and/or cfgsrv.log tab and what the driver returns.
The CP-UEGO device uses two synchronous I/O tasks: uegoin and uegoout. One instance of these processes is run for each board configured in the RTDB.